A Physical-Statistical Approach to AlGaN/GaN HEMT Reliability

Peter Moens, Arno Stockman. A Physical-Statistical Approach to AlGaN/GaN HEMT Reliability. In IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019. pages 1-6, IEEE, 2019. [doi]

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