Elham K. Moghaddam, Janusz Rajski, Sudhakar M. Reddy, Jakub Janicki. Low Test Data Volume Low Power At-Speed Delay Tests Using Clock-Gating. In Proceedings of the 20th IEEE Asian Test Symposium, ATS 2011, New Delhi, India, November 20-23, 2011. pages 267-272, IEEE Computer Society, 2011. [doi]
Abstract is missing.