Elham K. Moghaddam, Janusz Rajski, Sudhakar M. Reddy, Xijiang Lin, Nilanjan Mukherjee, Mark Kassab. Low capture power at-speed test in EDT environment. In Ron Press, Erik H. Volkerink, editors, 2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, November 2-4, 2010. pages 714-723, IEEE, 2010. [doi]
Abstract is missing.