Resistive Open Faults Detectability Analysis and Implications for Testing Low Power Nanometric ICs - researchr publication

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Mohamed Tagelsir Mohammadat, Noohul Basheer Zain Ali, Fawnizu Azmadi Hussin, Mark Zwolinski. Resistive Open Faults Detectability Analysis and Implications for Testing Low Power Nanometric ICs. IEEE Trans. VLSI Syst., 23(3):580-583, 2015. [doi]

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