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A Soft Error Tolerant Flip-Flop for eFPGA Configuration Hardening in 22nm FinFET Process

Prashanth Mohan, Siddharth Das, Oguz Atli, Josh Joffrion, Ken Mai. A Soft Error Tolerant Flip-Flop for eFPGA Configuration Hardening in 22nm FinFET Process. In Design, Automation & Test in Europe Conference, DATE 2025, Lyon, France, March 31 - April 2, 2025. pages 1-6, IEEE, 2025. [doi]

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Prashanth Mohan

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Siddharth Das

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Oguz Atli

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Josh Joffrion

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Ken Mai

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