External Links

Cite Key

Statistics

  • References: 0
  • Cited by: 0
  • Reviews: 0
  • Bibliographies: 0

PDF

Researchr

Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.

Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.

A Soft Error Tolerant Flip-Flop for eFPGA Configuration Hardening in 22nm FinFET Process

Prashanth Mohan, Siddharth Das, Oguz Atli, Josh Joffrion, Ken Mai. A Soft Error Tolerant Flip-Flop for eFPGA Configuration Hardening in 22nm FinFET Process. In Design, Automation & Test in Europe Conference, DATE 2025, Lyon, France, March 31 - April 2, 2025. pages 1-6, IEEE, 2025. [doi]

References

No references recorded for this publication.

Cited by

No citations of this publication recorded.

runs on