Nitin Mohan, W. Fung, Derek Wright, Manoj Sachdev. Design techniques and test methodology for low-power TCAMs. IEEE Trans. VLSI Syst., 14(6):573-586, 2006. [doi]
@article{MohanFWS06,
title = {Design techniques and test methodology for low-power TCAMs},
author = {Nitin Mohan and W. Fung and Derek Wright and Manoj Sachdev},
year = {2006},
doi = {10.1109/TVLSI.2006.878206},
url = {http://doi.ieeecomputersociety.org/10.1109/TVLSI.2006.878206},
tags = {testing, design},
researchr = {https://researchr.org/publication/MohanFWS06},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {14},
number = {6},
pages = {573-586},
}