Closed-Form Simulation and Robustness Models for SEU-Tolerant Design

Kartik Mohanram. Closed-Form Simulation and Robustness Models for SEU-Tolerant Design. In 23rd IEEE VLSI Test Symposium (VTS 2005), 1-5 May 2005, Palm Springs, CA, USA. pages 327-333, IEEE Computer Society, 2005. [doi]

Abstract

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