New Microcode s Generation Technique for Programmable Memory Built-In Self Test - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

NurQamarina MohdNoor, Azilah Saparon, Yusrina Yusof, Mahmud Adnan. New Microcode s Generation Technique for Programmable Memory Built-In Self Test. In Proceedings of the 19th IEEE Asian Test Symposium, ATS 2010, 1-4 December 2010, Shanghai, China. pages 407-412, IEEE Computer Society, 2010. [doi]

This author has not been identified. Look up 'NurQamarina MohdNoor' in GoogleThis author has not been identified. Look up 'Azilah Saparon' in GoogleThis author has not been identified. Look up 'Yusrina Yusof' in GoogleThis author has not been identified. Look up 'Mahmud Adnan' in Google

runs on WebDSL