NurQamarina MohdNoor, Azilah Saparon, Yusrina Yusof, Mahmud Adnan. New Microcode s Generation Technique for Programmable Memory Built-In Self Test. In Proceedings of the 19th IEEE Asian Test Symposium, ATS 2010, 1-4 December 2010, Shanghai, China. pages 407-412, IEEE Computer Society, 2010. [doi]
@inproceedings{MohdNoorSYA10,
title = {New Microcode s Generation Technique for Programmable Memory Built-In Self Test},
author = {NurQamarina MohdNoor and Azilah Saparon and Yusrina Yusof and Mahmud Adnan},
year = {2010},
doi = {10.1109/ATS.2010.76},
url = {http://dx.doi.org/10.1109/ATS.2010.76},
tags = {testing},
researchr = {https://researchr.org/publication/MohdNoorSYA10},
cites = {0},
citedby = {0},
pages = {407-412},
booktitle = {Proceedings of the 19th IEEE Asian Test Symposium, ATS 2010, 1-4 December 2010, Shanghai, China},
publisher = {IEEE Computer Society},
isbn = {978-0-7695-4248-5},
}