New Microcode s Generation Technique for Programmable Memory Built-In Self Test

NurQamarina MohdNoor, Azilah Saparon, Yusrina Yusof, Mahmud Adnan. New Microcode s Generation Technique for Programmable Memory Built-In Self Test. In Proceedings of the 19th IEEE Asian Test Symposium, ATS 2010, 1-4 December 2010, Shanghai, China. pages 407-412, IEEE Computer Society, 2010. [doi]

Abstract

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