Characterization of MWCNT VLSI Interconnect with Self-Heating Induced Scatterings - researchr publication authors

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K. M. Mohsin, Ashok Srivastava, Ashwani K. Sharma, Clay Mayberry. Characterization of MWCNT VLSI Interconnect with Self-Heating Induced Scatterings. In IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2014, Tampa, FL, USA, July 9-11, 2014. pages 368-373, IEEE, 2014. [doi]

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