K. M. Mohsin, Ashok Srivastava, Ashwani K. Sharma, Clay Mayberry. Characterization of MWCNT VLSI Interconnect with Self-Heating Induced Scatterings. In IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2014, Tampa, FL, USA, July 9-11, 2014. pages 368-373, IEEE, 2014. [doi]
@inproceedings{MohsinSSM14,
title = {Characterization of MWCNT VLSI Interconnect with Self-Heating Induced Scatterings},
author = {K. M. Mohsin and Ashok Srivastava and Ashwani K. Sharma and Clay Mayberry},
year = {2014},
doi = {10.1109/ISVLSI.2014.31},
url = {http://dx.doi.org/10.1109/ISVLSI.2014.31},
researchr = {https://researchr.org/publication/MohsinSSM14},
cites = {0},
citedby = {0},
pages = {368-373},
booktitle = {IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2014, Tampa, FL, USA, July 9-11, 2014},
publisher = {IEEE},
}