Towards Automatic Nanomanipulation: Drift Compensation in Scanning Probe Microscopes

Babak Mokaberi, Aristides A. G. Requicha. Towards Automatic Nanomanipulation: Drift Compensation in Scanning Probe Microscopes. In Proceedings of the 2004 IEEE International Conference on Robotics and Automation, ICRA 2004, April 26 - May 1, 2004, New Orleans, LA, USA. pages 416-421, IEEE, 2004. [doi]

Authors

Babak Mokaberi

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Aristides A. G. Requicha

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