Babak Mokaberi, Aristides A. G. Requicha. Towards Automatic Nanomanipulation: Drift Compensation in Scanning Probe Microscopes. In Proceedings of the 2004 IEEE International Conference on Robotics and Automation, ICRA 2004, April 26 - May 1, 2004, New Orleans, LA, USA. pages 416-421, IEEE, 2004. [doi]
Abstract is missing.