A testing scheme for mixed-control based reversible circuits

Bappaditya Mondal, Chandan Bandyopadhyay, Hafizur Rahaman. A testing scheme for mixed-control based reversible circuits. In Sixth International Symposium on Embedded Computing and System Design, ISED 2016, Patna, India, December 15-17, 2016. pages 96-100, IEEE, 2016. [doi]

Authors

Bappaditya Mondal

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Chandan Bandyopadhyay

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Hafizur Rahaman

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