Bappaditya Mondal, Chandan Bandyopadhyay, Hafizur Rahaman. A testing scheme for mixed-control based reversible circuits. In Sixth International Symposium on Embedded Computing and System Design, ISED 2016, Patna, India, December 15-17, 2016. pages 96-100, IEEE, 2016. [doi]
@inproceedings{MondalBR16,
title = {A testing scheme for mixed-control based reversible circuits},
author = {Bappaditya Mondal and Chandan Bandyopadhyay and Hafizur Rahaman},
year = {2016},
doi = {10.1109/ISED.2016.7977062},
url = {https://doi.org/10.1109/ISED.2016.7977062},
researchr = {https://researchr.org/publication/MondalBR16},
cites = {0},
citedby = {0},
pages = {96-100},
booktitle = {Sixth International Symposium on Embedded Computing and System Design, ISED 2016, Patna, India, December 15-17, 2016},
publisher = {IEEE},
isbn = {978-1-5090-2541-1},
}