B. Mongellaz, F. Marc, Y. Danto. Ageing simulation of MOSFET circuit using a VHDL-AMS behavioural modelling: an experimental case study. Microelectronics Reliability, 43(9-11):1513-1518, 2003. [doi]
@article{MongellazMD03,
title = {Ageing simulation of MOSFET circuit using a VHDL-AMS behavioural modelling: an experimental case study},
author = {B. Mongellaz and F. Marc and Y. Danto},
year = {2003},
doi = {10.1016/S0026-2714(03)00268-3},
url = {http://dx.doi.org/10.1016/S0026-2714(03)00268-3},
tags = {case study},
researchr = {https://researchr.org/publication/MongellazMD03},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {43},
number = {9-11},
pages = {1513-1518},
}