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D. Monti, Matteo Meneghini, Carlo De Santi, Gaudenzio Meneghesso, Enrico Zanoni, A. Bojarska, Piotr Perlin. Long-term degradation of InGaN-based laser diodes: Role of defects. Microelectronics Reliability, 76:584-587, 2017. [doi]
Abstract is missing.