Analysis and modeling for random telegraph noise of GIDL current in saddle MOSFET for DRAM application

Dyukyoung Moon, Hyunseul Lee, Changhwan Shin, Hyungcheol Shin. Analysis and modeling for random telegraph noise of GIDL current in saddle MOSFET for DRAM application. IEICE Electronic Express, 11(13):20140468, 2014. [doi]

Abstract

Abstract is missing.