Jon Moore, Qian Cui. GIS analysis of U.S. patent data: examining local innovation patterns. In Lindi Liao, editor, Proceedings of the 2nd International Conference and Exhibition on Computing for Geospatial Research & Application, COM.Geo 2011, Washington, DC, USA, May 23-25, 2011. ACM International Conference Proceeding Series, pages 19, ACM, 2011. [doi]
Abstract is missing.