Design and analysis of piezoelectric cantilevers with enhanced higher eigenmodes for atomic force microscopy

Steven I. Moore, Michael G. Ruppert, Yuen K. Yong. Design and analysis of piezoelectric cantilevers with enhanced higher eigenmodes for atomic force microscopy. In IEEE International Conference on Advanced Intelligent Mechatronics, AIM 2017, Munich, Germany, July 3-7, 2017. pages 719-724, IEEE, 2017. [doi]

Abstract

Abstract is missing.