Thorben Moos, Amir Moradi 0001, Bastian Richter. Static power side-channel analysis of a threshold implementation prototype chip. In David Atienza, Giorgio Di Natale, editors, Design, Automation & Test in Europe Conference & Exhibition, DATE 2017, Lausanne, Switzerland, March 27-31, 2017. pages 1324-1329, IEEE, 2017. [doi]
@inproceedings{Moos0R17,
title = {Static power side-channel analysis of a threshold implementation prototype chip},
author = {Thorben Moos and Amir Moradi 0001 and Bastian Richter},
year = {2017},
doi = {10.23919/DATE.2017.7927198},
url = {https://doi.org/10.23919/DATE.2017.7927198},
researchr = {https://researchr.org/publication/Moos0R17},
cites = {0},
citedby = {0},
pages = {1324-1329},
booktitle = {Design, Automation & Test in Europe Conference & Exhibition, DATE 2017, Lausanne, Switzerland, March 27-31, 2017},
editor = {David Atienza and Giorgio Di Natale},
publisher = {IEEE},
isbn = {978-3-9815370-8-6},
}