Thorben Moos, Amir Moradi 0001, Bastian Richter. Static power side-channel analysis of a threshold implementation prototype chip. In David Atienza, Giorgio Di Natale, editors, Design, Automation & Test in Europe Conference & Exhibition, DATE 2017, Lausanne, Switzerland, March 27-31, 2017. pages 1324-1329, IEEE, 2017. [doi]
Abstract is missing.