Effectiveness of Low-Voltage Testing to Detect Interconnect Open Defects Under Process Variations

Jesus Moreno, Michel Renovell, VĂ­ctor H. Champac. Effectiveness of Low-Voltage Testing to Detect Interconnect Open Defects Under Process Variations. IEEE Trans. VLSI Syst., 24(1):378-382, 2016. [doi]

Abstract

Abstract is missing.