Fukashi Morishita, Masanori Otsuka, Wataru Saito. An ADC Test Technique With Dual-Path/Multi-Functional Fine Pattern Generator Realizing High Accuracy Measurement for CMOS Image Sensor. In 29th IEEE Asian Test Symposium, ATS 2020, Penang, Malaysia, November 23-26, 2020. pages 1-6, IEEE, 2020. [doi]
Abstract is missing.