Efficient Analysis for Mitigation of Workload-Dependent Aging Degradation

Shumpei Morita, Song Bian 0001, Michihiro Shintani, Takashi Sato. Efficient Analysis for Mitigation of Workload-Dependent Aging Degradation. IEEE Trans. on CAD of Integrated Circuits and Systems, 41(12):5515-5525, 2022. [doi]

Abstract

Abstract is missing.