Amirhossein Moshrefi, Hossein Aghababa, Omid Shoaei. An aging-aware model for the leakage power of nanoscaled digital integrated circuits in IoT era. In 24th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2017, Batumi, Georgia, December 5-8, 2017. pages 343-346, IEEE, 2017. [doi]
Abstract is missing.