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Hassan Mostafa, Mohab Anis, Mohamed I. Elmasry. Analytical Soft Error Models Accounting for Die-to-Die and Within-Die Variations in Sub-Threshold SRAM Cells. IEEE Trans. VLSI Syst., 19(2):182-195, 2011. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: A Design-Oriented Soft Error Rate Variation Model Accounting for Both Die-to-Die and Within-Die Variations in Submicrometer CMOS SRAM CellsHassan Mostafa, Mohab Anis, Mohamed I. Elmasry. tcas, 57-I(6):1298-1311, 2010. [doi] A Statistical Design-Oriented Delay Variation Model Accounting for Within-Die VariationsMohamed H. Abu-Rahma, Mohab Anis. tcad, 27(11):1983-1995, 2008. [doi]
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