Functional Test Generation for In-Field Testing of Deep Learning Models with Test Storage Constraints - researchr publication

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Dina A. Moussa, Michael Hefenbrock, Mehdi B. Tahoori. Functional Test Generation for In-Field Testing of Deep Learning Models with Test Storage Constraints. In IEEE International Test Conference, ITC 2025, San Diego, CA, USA, September 20-26, 2025. pages 223-232, IEEE, 2025. [doi]

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