Gary C. Moyer, Mark Clements, Wentai Liu, Toby Schaffer, Ralph K. Cavin III. The delay vernier pattern generation technique. J. Solid-State Circuits, 32(4):551-562, 1997. [doi]
@article{MoyerCLSC97,
title = {The delay vernier pattern generation technique},
author = {Gary C. Moyer and Mark Clements and Wentai Liu and Toby Schaffer and Ralph K. Cavin III},
year = {1997},
doi = {10.1109/4.563677},
url = {https://doi.org/10.1109/4.563677},
researchr = {https://researchr.org/publication/MoyerCLSC97},
cites = {0},
citedby = {0},
journal = {J. Solid-State Circuits},
volume = {32},
number = {4},
pages = {551-562},
}