Efficient On-Chip Randomness Testing Utilizing Machine Learning Techniques

Vojtech Mrazek, Lukás Sekanina, Roland Dobai, Marek Sýs, Petr Svenda. Efficient On-Chip Randomness Testing Utilizing Machine Learning Techniques. IEEE Trans. VLSI Syst., 27(12):2734-2744, 2019. [doi]

Abstract

Abstract is missing.