A deterministic BIST scheme based on EDT-compressed test patterns - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Grzegorz Mrugalski, Janusz Rajski, Lukasz Rybak, Jedrzej Solecki, Jerzy Tyszer. A deterministic BIST scheme based on EDT-compressed test patterns. In 2015 IEEE International Test Conference, ITC 2015, Anaheim, CA, USA, October 6-8, 2015. pages 1-8, IEEE, 2015. [doi]

This author has not been identified. Look up 'Grzegorz Mrugalski' in GoogleThis author has not been identified. Look up 'Janusz Rajski' in GoogleThis author has not been identified. Look up 'Lukasz Rybak' in GoogleThis author has not been identified. Look up 'Jedrzej Solecki' in GoogleThis author has not been identified. Look up 'Jerzy Tyszer' in Google

runs on WebDSL