Grzegorz Mrugalski, Janusz Rajski, Lukasz Rybak, Jedrzej Solecki, Jerzy Tyszer. A deterministic BIST scheme based on EDT-compressed test patterns. In 2015 IEEE International Test Conference, ITC 2015, Anaheim, CA, USA, October 6-8, 2015. pages 1-8, IEEE, 2015. [doi]
@inproceedings{MrugalskiRRST15,
title = {A deterministic BIST scheme based on EDT-compressed test patterns},
author = {Grzegorz Mrugalski and Janusz Rajski and Lukasz Rybak and Jedrzej Solecki and Jerzy Tyszer},
year = {2015},
doi = {10.1109/TEST.2015.7342398},
url = {http://dx.doi.org/10.1109/TEST.2015.7342398},
researchr = {https://researchr.org/publication/MrugalskiRRST15},
cites = {0},
citedby = {0},
pages = {1-8},
booktitle = {2015 IEEE International Test Conference, ITC 2015, Anaheim, CA, USA, October 6-8, 2015},
publisher = {IEEE},
isbn = {978-1-4673-6578-9},
}