Grzegorz Mrugalski, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer, Chen Wang. TestExpress - New Time-Effective Scan-Based Deterministic Test Paradigm. In 24th IEEE Asian Test Symposium, ATS 2015, Mumbai, India, November 22-25, 2015. pages 19-24, IEEE, 2015. [doi]
Abstract is missing.