Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer. High Speed Ring Generators and Compactors of Test Data. In 21st IEEE VLSI Test Symposium (VTS 2003), 27 April - 1 May 2003, Napa Valley, CA, USA. pages 57-62, IEEE Computer Society, 2003. [doi]
@inproceedings{MrugalskiRT03,
title = {High Speed Ring Generators and Compactors of Test Data},
author = {Grzegorz Mrugalski and Janusz Rajski and Jerzy Tyszer},
year = {2003},
url = {http://csdl.computer.org/comp/proceedings/vts/2003/1924/00/19240057abs.htm},
tags = {testing, data-flow},
researchr = {https://researchr.org/publication/MrugalskiRT03},
cites = {0},
citedby = {0},
pages = {57-62},
booktitle = {21st IEEE VLSI Test Symposium (VTS 2003), 27 April - 1 May 2003, Napa Valley, CA, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-1924-5},
}