X-Masking for In-System Deterministic Test

Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer, Bartosz Wlodarczak. X-Masking for In-System Deterministic Test. In IEEE European Test Symposium, ETS 2022, Barcelona, Spain, May 23-27, 2022. pages 1-6, IEEE, 2022. [doi]

Abstract

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