Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer, Bartosz Wlodarczak. DIST: Deterministic In-System Test with X-masking. In IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022. pages 20-27, IEEE, 2022. [doi]
Abstract is missing.