Szu-Pang Mu, Wen-Hsiang Chang, Mango C.-T. Chao, Yi-Ming Wang, Ming-Tung Chang, Min-Hsiu Tsai. Statistical methodology to identify optimal placement of on-chip process monitors for predicting fmax. In Frank Liu, editor, Proceedings of the 35th International Conference on Computer-Aided Design, ICCAD 2016, Austin, TX, USA, November 7-10, 2016. pages 116, ACM, 2016. [doi]
Abstract is missing.