Anand S. Mudlapur, Vishwani D. Agrawal, Adit D. Singh. A random access scans architecture to reduce hardware overhead. In Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005. pages 9, IEEE, 2005. [doi]
@inproceedings{MudlapurAS05, title = {A random access scans architecture to reduce hardware overhead}, author = {Anand S. Mudlapur and Vishwani D. Agrawal and Adit D. Singh}, year = {2005}, doi = {10.1109/TEST.2005.1583993}, url = {http://doi.ieeecomputersociety.org/10.1109/TEST.2005.1583993}, researchr = {https://researchr.org/publication/MudlapurAS05}, cites = {0}, citedby = {0}, pages = {9}, booktitle = {Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005}, publisher = {IEEE}, isbn = {0-7803-9038-5}, }