Qualitative assessment of epitaxial graphene FETs on SiC substrates via pulsed measurements and temperature variation

C. Mukherjee, Sébastien Fregonese, Thomas Zimmer, C. Maneux, H. Happy, D. Mele. Qualitative assessment of epitaxial graphene FETs on SiC substrates via pulsed measurements and temperature variation. In 44th European Solid State Device Research Conference, ESSDERC 2014, Venice Lido, Italy, September 22-26, 2014. pages 305-308, IEEE, 2014. [doi]

Abstract

Abstract is missing.