Leveraging pre-silicon data to diagnose out-of-specification failures in mixed-signal circuits - researchr publication authors

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Parijat Mukherjee, Peng Li. Leveraging pre-silicon data to diagnose out-of-specification failures in mixed-signal circuits. In The 51st Annual Design Automation Conference 2014, DAC '14, San Francisco, CA, USA, June 1-5, 2014. pages 1-6, ACM, 2014. [doi]

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