Parijat Mukherjee, Peng Li. Leveraging pre-silicon data to diagnose out-of-specification failures in mixed-signal circuits. In The 51st Annual Design Automation Conference 2014, DAC '14, San Francisco, CA, USA, June 1-5, 2014. pages 1-6, ACM, 2014. [doi]
@inproceedings{MukherjeeL14, title = {Leveraging pre-silicon data to diagnose out-of-specification failures in mixed-signal circuits}, author = {Parijat Mukherjee and Peng Li}, year = {2014}, doi = {10.1145/2593069.2593154}, url = {http://doi.acm.org/10.1145/2593069.2593154}, researchr = {https://researchr.org/publication/MukherjeeL14}, cites = {0}, citedby = {0}, pages = {1-6}, booktitle = {The 51st Annual Design Automation Conference 2014, DAC '14, San Francisco, CA, USA, June 1-5, 2014}, publisher = {ACM}, isbn = {978-1-4503-2730-5}, }