High Throughput Diagnosis via Compression of Failure Data in Embedded Memory BIST

Nilanjan Mukherjee, Artur Pogiel, Janusz Rajski, Jerzy Tyszer. High Throughput Diagnosis via Compression of Failure Data in Embedded Memory BIST. In Douglas Young, Nur A. Touba, editors, 2008 IEEE International Test Conference, ITC 2008, Santa Clara, California, USA, October 26-31, 2008. pages 1-10, IEEE, 2008. [doi]

Abstract

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