High Volume Diagnosis in Memory BIST Based on Compressed Failure Data

Nilanjan Mukherjee, Artur Pogiel, Janusz Rajski, Jerzy Tyszer. High Volume Diagnosis in Memory BIST Based on Compressed Failure Data. IEEE Trans. on CAD of Integrated Circuits and Systems, 29(3):441-453, 2010. [doi]

Abstract

Abstract is missing.