Nilanjan Mukherjee, Janusz Rajski. Digital Testing of ICs for Automotive Applications. In 29th International Conference on VLSI Design and 15th International Conference on Embedded Systems, VLSID 2016, Kolkata, India, January 4-8, 2016. pages 14-16, IEEE Computer Society, 2016. [doi]
@inproceedings{MukherjeeR16-0,
title = {Digital Testing of ICs for Automotive Applications},
author = {Nilanjan Mukherjee and Janusz Rajski},
year = {2016},
doi = {10.1109/VLSID.2016.134},
url = {http://doi.ieeecomputersociety.org/10.1109/VLSID.2016.134},
researchr = {https://researchr.org/publication/MukherjeeR16-0},
cites = {0},
citedby = {0},
pages = {14-16},
booktitle = {29th International Conference on VLSI Design and 15th International Conference on Embedded Systems, VLSID 2016, Kolkata, India, January 4-8, 2016},
publisher = {IEEE Computer Society},
isbn = {978-1-4673-8700-2},
}