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Digital Testing of ICs for Automotive Applications

Nilanjan Mukherjee, Janusz Rajski. Digital Testing of ICs for Automotive Applications. In 29th International Conference on VLSI Design and 15th International Conference on Embedded Systems, VLSID 2016, Kolkata, India, January 4-8, 2016. pages 14-16, IEEE Computer Society, 2016. [doi]

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