Saibal Mukhopadhyay, Keunwoo Kim, Keith A. Jenkins, Ching-Te Chuang, Kaushik Roy. Statistical Characterization and On-Chip Measurement Methods for Local Random Variability of a Process Using Sense-Amplifier-Based Test Structure. In 2007 IEEE International Solid-State Circuits Conference, ISSCC 2007, Digest of Technical Papers, San Francisco, CA, USA, February 11-15, 2007. pages 400-611, IEEE, 2007. [doi]
@inproceedings{MukhopadhyayKJCR07,
title = {Statistical Characterization and On-Chip Measurement Methods for Local Random Variability of a Process Using Sense-Amplifier-Based Test Structure},
author = {Saibal Mukhopadhyay and Keunwoo Kim and Keith A. Jenkins and Ching-Te Chuang and Kaushik Roy},
year = {2007},
doi = {10.1109/ISSCC.2007.373463},
url = {http://dx.doi.org/10.1109/ISSCC.2007.373463},
researchr = {https://researchr.org/publication/MukhopadhyayKJCR07},
cites = {0},
citedby = {0},
pages = {400-611},
booktitle = {2007 IEEE International Solid-State Circuits Conference, ISSCC 2007, Digest of Technical Papers, San Francisco, CA, USA, February 11-15, 2007},
publisher = {IEEE},
isbn = {1-4244-0853-9},
}