Keith A. Jenkins - researchr alias

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Viewing Publication 1 - 33 from 33

2018

Estimating transistor channel temperature using time-resolved and time-integrated NIR emissionFranco Stellari, Alan J. Weger, Keith A. Jenkins, Giuseppe La Rosa, Barry P. Linder, Peilin Song. irps 2018: 6 [doi]

Effect of HCI degradation on the variability of MOSFETSC. Zhou, Keith A. Jenkins, P. I. Chuang, Christos Vezyrtzis. irps 2018: 1 [doi]

2016

A statistical critical path monitor in 14nm CMOSBruce M. Fleischer, Christos Vezyrtzis, Karthik Balakrishnan, Keith A. Jenkins. iccd 2016: 507-511 [doi]

2015

A Ring-Oscillator-Based Reliability Monitor for Isolated Measurement of NBTI and PBTI in High-k/Metal Gate TechnologyTony Tae-Hyoung Kim, Pong-Fei Lu, Keith A. Jenkins, Chris H. Kim. tvlsi, 23(7):1360-1364, 2015. [doi]

Long-term data for BTI degradation in 32nm IBM microprocessor using HKMG technologyPong-Fei Lu, Keith A. Jenkins, K. Paul Muller, Ralf Schaufler. irps 2015: 6 [doi]

Self-heating characterization of FinFET SOI devices using 2D time resolved emission measurementsFranco Stellari, Keith A. Jenkins, Alan J. Weger, Barry P. Linder, Peilin Song. irps 2015: 2 [doi]

2014

2013

On-chip circuit to monitor long-term NBTI and PBTI degradationKeith A. Jenkins, Pong-Fei Lu. mr, 53(9-11):1252-1256, 2013. [doi]

Performance impact of through-silicon vias (TSVs) in three-dimensional technology measured by SRAM ring oscillatorsJente B. Kuang, Keith A. Jenkins, Kevin Stawiasz, Jeremy D. Schaub. esscirc 2013: 419-422 [doi]

2011

A simple array-based test structure for the AC variability characterization of MOSFETsKarthik Balakrishnan, Keith A. Jenkins, Duane S. Boning. isqed 2011: 539-544 [doi]

2009

A Scalable, Digital BIST Circuit for Measurement and Compensation of Static Phase OffsetKeith A. Jenkins, Lionel Li. vts 2009: 185-188 [doi]

A Local Random Variability Detector With Complete Digital On-Chip Measurement CircuitryRahul M. Rao, Keith A. Jenkins, Jae-Joon Kim. jssc, 44(9):2616-2623, 2009. [doi]

2008

2007

On-Chip Circuit for Measuring Period Jitter and Skew of Clock Distribution NetworksKeith A. Jenkins, Kenneth L. Shepard, Zheng Xu. cicc 2007: 157-160 [doi]

Statistical Characterization and On-Chip Measurement Methods for Local Random Variability of a Process Using Sense-Amplifier-Based Test StructureSaibal Mukhopadhyay, Keunwoo Kim, Keith A. Jenkins, Ching-Te Chuang, Kaushik Roy. isscc 2007: 400-611 [doi]

2005

2004

CMOS IC diagnostics using the luminescence of OFF-state leakage currentsStas Polonsky, Keith A. Jenkins, Alan J. Weger, Shinho Cho. itc 2003: 134-139 [doi]

Delay chain based programmable jitter generatorTian Xia, Peilin Song, Keith A. Jenkins, Jien-Chung Lo. ets 2004: 16-21 [doi]

2003

2001

A clock distribution network for microprocessorsPhillip J. Restle, Timothy G. McNamara, David A. Webber, Peter J. Camporese, Kwok F. Eng, Keith A. Jenkins, David H. Allen, Michael J. Rohn, Michael P. Quaranta, David W. Boerstler, Charles J. Alpert, Craig A. Carter, Roger N. Bailey, John G. Petrovick, Byron L. Krauter, Bradley D. McCredie. jssc, 36(5):792-799, 2001. [doi]

2000

Measuring Jitter and Phase Error in Microprocessor Phase-Locked LoopsKeith A. Jenkins, James P. Eckhardt. dt, 17(2):86-93, 2000. [doi]

1998

1997

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