Effect of HCI degradation on the variability of MOSFETS

C. Zhou, Keith A. Jenkins, P. I. Chuang, Christos Vezyrtzis. Effect of HCI degradation on the variability of MOSFETS. In IEEE International Reliability Physics Symposium, IRPS 2018, Burlingame, CA, USA, March 11-15, 2018. pages 1, IEEE, 2018. [doi]

Abstract

Abstract is missing.